Analytical methods EPMA (Electron-probe microanalysis)SEM (Secondary electron microscopy)TEM (Transmission electron microscopy)(LAM) ICP-MS (Laser ablation)XRF (X-ray fluorescence)XRD (X-ray diffraction)XRT (X-ray tomography)SIMS (Secondary ion mass spectrometry)(N)TIMS (Thermal ionization mass spectrometry)INAA (Instrumental neutron activation analysis)ImageJ (Image analysing)QEMSCAN (Automated mineralogy)MLA (Mineral liberation analysis)SHRIMP (Sensitive High Resolution Ion Microprobe)FA (fire assay/assay)Ore microscopyAAS (Atomic absorption spectroscopy)Raman SpectroscopyTFD-MS (ThermoFinnigan Delta mass spectrometry)CathodoluminiscencePIXE (Particle-induced X-ray emission)

Sample Preparation Polished mountsHand-picking